Atomic force microscopy imaging of plant cell walls.

This review focuses on the application of atomic force microscopy (AFM) for in situ nanoscale imaging and characterization of plant cell walls, which are complex biopolymer structures essential for plant shape, support, and stress responses. AFM enables high-resolution, nondestructive visualization of cell wall architecture, mechanical properties, molecular interactions, and surface potentials under near-physiological conditions, overcoming limitations of traditional imaging methods. Recent advances include multiparametric AFM modes for mapping nanomechanics and molecular recognition, integration with infrared and Raman spectroscopy for simultaneous chemical and structural analysis, and Kelvin probe force microscopy (KPFM) for surface potential mapping. The review highlights challenges such as sample immobilization, tip functionalization, and imaging speed, and suggests future directions involving high-speed AFM, multimodal approaches, and combined techniques to deepen understanding of cell wall biosynthesis, mechanics, and plant development.