JOURNAL ARTICLE

CNN‐based defect detection in manufacturing.

  • Published In: Advanced Control for Applications, 2024, v. 6, n. 4. P. 1 1 of 3

  • Database: Applied Science & Technology Source Ultimate 2 of 3

  • Authored By: Hou, Ming; LI, PENGCHENG; Cheng, Shiqi; Yv, Jingyao 3 of 3

Abstract

This research introduces an advanced algorithm based on convolutional neural networks for the detection and categorization of surface defects in manufacturing processes. At its core, the algorithm employs a deep learning model that integrates residual networks and attention mechanisms to effectively extract features. Additionally, we have developed a novel feature selection method, named NR, which synergistically combines neighborhood component analysis and ReliefF techniques. This approach enables the selection of more representative deep features for subsequent analysis. For the classification task, we utilize the support vector machine technique, which demonstrates versatility in handling both binary and multi‐class classification scenarios. The reliability and superiority of our algorithm are further validated through a comparative analysis using a dataset specifically tailored for this context. The results indicate that our approach outperforms existing algorithms in accurately identifying manufacturing defects. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:Advanced Control for Applications. 2024/12, Vol. 6, Issue 4, p1
  • Document Type:Article
  • Subject Area:Business and Management
  • Publication Date:2024
  • ISSN:25780727
  • DOI:10.1002/adc2.196
  • Accession Number:181778204
  • Copyright Statement:Copyright of Advanced Control for Applications is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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