JOURNAL ARTICLE

Spectroscopic analysis of lead lanthanum zirconate titanate films using UV-VIS and ellipsometry.

  • Published In: Surface Science Spectra, 2024, v. 31, n. 1. P. 1 1 of 3

  • Database: Applied Science & Technology Source Ultimate 2 of 3

  • Authored By: Kotru, Sushma; Kothapally, Sneha; Hilfiker, James N. 3 of 3

Abstract

This article focuses on the characterization of the optical properties of ferroelectric lead lanthanum zirconate titanate (PLZT) films, specifically Pb₀.₉₅La₀.₀₅Zr₀.₅₄Ti₀.₄₆O₃, deposited on platinized silicon substrates using chemical solution deposition and annealed at 650 and 750 °C. Using ultraviolet-visible (UV-VIS) spectrophotometry and spectroscopic ellipsometry, the study measured reflectance, amplitude ratio (Ψ), and phase difference (Δ) spectra to determine optical constants such as refractive index, extinction coefficient, and bandgap energy. The PLZT films exhibited strong ultraviolet absorption with bandgap values around 3.5 eV and showed no significant changes in optical constants between the two annealing temperatures, highlighting their potential for optoelectronic and UV sensing applications. The article provides detailed methodology and modeling approaches, including the use of Cody–Lorentz oscillators, to extract these optical parameters.

Additional Information

  • Source:Surface Science Spectra. 2024/06, Vol. 31, Issue 1, p1
  • Document Type:Article
  • Subject Area:Chemistry
  • Publication Date:2024
  • ISSN:10555269
  • DOI:10.1116/6.0002972
  • Accession Number:178147201
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