JOURNAL ARTICLE
First‐Principles Calculations to Investigate the Ground State, Mechanical Stability, Electronic Structure, and Optical Properties of Tl2SnX3 (X = S, Se, Te).
Published In: Crystal Research & Technology, 2024, v. 59, n. 4. P. 1 1 of 3
Database: Academic Search Ultimate 2 of 3
Authored By: Alhussain, Hanen; Ferjani, Hela; Ben Smida, Youssef 3 of 3
Abstract
In this work, the Density Functional Theory (DFT) analysis of the Tl2SnX3 series (X = S, Se, Te) is performed, and the ground states are confirmed by the calculation of the elastic constant Cij. Based on the DFT calculation, the Tl2SnX3 structures are direct‐gap semiconductors with bandgaps of 1.434, 1.181, and 0.907 eV, respectively. Chalcogen substitution significantly impacts their electronic structures, notably increasing the Density of States (DOS) width in the valence band from sulfur to tellurium, and shifting the dielectric function's real part, ε1(ω), toward lower energies. This change means that the optical activity and response to electric fields are better, with Tl2SnTe3 showing the best polarization response and light‐matter interaction abilities. Optical tests show that Tl2SnTe3 has very high optical absorption, peaking at ≈17 × 104 cm−1 along [010], and reflectivity levels above 90%, marking its suitability for high‐reflectivity applications. Moreover, loss energy function analysis also shows that Tl2SnTe3 has a strong electron loss resonance at lower energies, which means it has strong interactions with electrons. [ABSTRACT FROM AUTHOR]
Additional Information
- Source:Crystal Research & Technology. 2024/04, Vol. 59, Issue 4, p1
- Document Type:Article
- Subject Area:Chemistry
- Publication Date:2024
- ISSN:0232-1300
- DOI:10.1002/crat.202300340
- Accession Number:176495985
- Copyright Statement:Copyright of Crystal Research & Technology is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Looking to go deeper into this topic? Look for more articles on EBSCOhost.