JOURNAL ARTICLE

Signal enhancement of rectangular wave eddy current testing via compensation using digital-to-analog converter.

  • Published In: International Journal of Applied Electromagnetics & Mechanics, 2023, v. 71. P. S39 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Sasayama, Teruyoshi; Guo, Ziwei 3 of 3

Abstract

This article focuses on improving rectangular wave eddy current testing (RECT), a non-destructive method using rectangular wave excitation current to detect flaws in thick metal specimens. The study addresses interference from high-frequency harmonic signals that obscure low-frequency flaw signals by implementing a compensation method with a digital-to-analog converter (DAC) in an electronic bridge circuit. Experiments on a 12 mm thick aluminum plate with backside drill holes demonstrated that flaw signals, undetectable without compensation, became clearly identifiable using the proposed method. The results indicate that this compensation technique enhances low-frequency signal amplification in RECT, enabling effective detection of subsurface defects in thick metals.

Additional Information

  • Source:International Journal of Applied Electromagnetics & Mechanics. 2023/04, Vol. 71, pS39
  • Document Type:Article
  • Subject Area:Computer Science
  • Publication Date:2023
  • ISSN:1383-5416
  • DOI:10.3233/JAE-220106
  • Accession Number:163109477
  • Copyright Statement:Copyright of International Journal of Applied Electromagnetics & Mechanics is the property of Sage Publications Inc. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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