JOURNAL ARTICLE

Strongly Coupled Circuit‐Magnetic‐Structural Effect on Winding Vibration Process of Power Transformer.

  • Published In: IEEJ Transactions on Electrical & Electronic Engineering, 2024, v. 19, n. 7. P. 1147 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Jin, Mingkai; Sha, Zhiyuan; Zhao, Yi; Chen, Weijiang; Zhang, Qiaogen; Wen, Tao 3 of 3

Abstract

Short‐circuit forces, which result in violent vibration of power transformer windings, are induced by the interaction between the short‐circuit currents and the leakage magnetic induction. During vibration, the rearrangements of disks affect the magnetic flux distribution, which leads to time‐varying equivalent reactance and further changes of currents and forces. When a short‐circuit accident occurs, these processes happen simultaneously and constantly. In this article, the influence of circuit parameters on short‐circuit currents is analyzed. The strongly coupled phenomenon between equivalent circuit, magnetic field and structural field is explicated, and the method to obtain vibration process with strongly coupled phenomenon considered is proposed. Then the strongly coupled effect on vibration process is investigated. The vibration process is characterized by the time‐varying currents, electromagnetic forces and displacements. The space coefficient is defined to represent the magnetic flux distribution. The changes of maximum value and its occurrence time of the characteristic parameters are obtained. The peak values of the short‐circuit forces and displacements increase and the waveforms change, which is caused by the distortions of leakage magnetic flux and the changes of spatial ampere‐turn balance during vibration. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:IEEJ Transactions on Electrical & Electronic Engineering. 2024/07, Vol. 19, Issue 7, p1147
  • Document Type:Article
  • Subject Area:Engineering
  • Publication Date:2024
  • ISSN:1931-4973
  • DOI:10.1002/tee.24062
  • Accession Number:177627351
  • Copyright Statement:Copyright of IEEJ Transactions on Electrical & Electronic Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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