JOURNAL ARTICLE

Theoretical approach to thermal sensitivity capability of metal-semiconductor diodes with different Schottky contact area.

  • Published In: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 2023, v. 41, n. 6. P. 1 1 of 3

  • Database: Applied Science & Technology Source Ultimate 2 of 3

  • Authored By: Turut, Abdulmecit 3 of 3

Abstract

This article focuses on the thermal sensitivity capability of Schottky barrier diodes (SBDs), specifically Au/n-GaAs SBDs, as a function of the Schottky contact (SC) area size and current level. Using numerical simulations based on the thermionic emission (TE) current model, it demonstrates that the thermal sensitivity coefficient (α) increases with larger SC areas and decreases with higher current levels at a given SC size. The study also finds that SBDs with larger SC areas are more suitable for cryogenic temperature sensing at low current levels, while smaller SC areas perform better at higher temperatures and current levels. These theoretical results align with experimental findings and provide guidance for optimizing SBD design in temperature, pressure, and gas composition sensing applications across a wide temperature range.

Additional Information

  • Source:Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics. 2023/12, Vol. 41, Issue 6, p1
  • Document Type:Article
  • Subject Area:Engineering
  • Publication Date:2023
  • ISSN:21662746
  • DOI:10.1116/6.0002976
  • Accession Number:174421032
  • Copyright Statement:Copyright of Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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