JOURNAL ARTICLE
HAXPES Cr Kα measurement of bulk indium.
Published In: Surface Science Spectra, 2023, v. 30, n. 2. P. 1 1 of 3
Database: Applied Science & Technology Source Ultimate 2 of 3
Authored By: Zborowski, C.; Vanleenhove, A.; Hoflijk, I.; Vaesen, I.; Artyushkova, K.; Conard, T. 3 of 3
Abstract
This article presents reference spectra of indium analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES) with monochromatic chromium Kα radiation at 5414.8 eV. The study provides detailed survey and high-resolution spectra for multiple indium core levels, including In 2s, In 2p₃/₂, In 3s, In 3p₃/₂, In 3d, In 4s, and In 4d, obtained from a 99.999% pure indium foil specimen. Measurements were conducted using a ULVAC-PHI Quantes spherical sector analyzer under controlled conditions, with in situ Ar⁺ sputter cleaning to remove surface contaminants. The data serve as reliable reference material for researchers utilizing lab-scale HAXPES instruments and contribute to the limited availability of high-energy photoemission spectra for common materials.
Additional Information
- Source:Surface Science Spectra. 2023/12, Vol. 30, Issue 2, p1
- Document Type:Article
- Subject Area:Geology
- Publication Date:2023
- ISSN:10555269
- DOI:10.1116/6.0003161
- Accession Number:174524166
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