Obvious difference between protons and electrons irradiation on the performance of graphene devices.

  • Published In: International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2023, v. 37, n. 21. P. 1 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Cui, Naiyuan; Liu, Yuming; Jiang, Haifu; Guo, Jiali 3 of 3

Abstract

The effects of energetic electron and proton irradiation on graphene-based devices were investigated. The focus of the study was on the electrical properties of graphene devices exposed to electron and proton beams. Field-effect transistors (FETs) were fabricated using graphene and then irradiated by high-energy electrons and protons of 40 keV that are comparable to the aerospace radiation environment. The deterioration of electric properties, especially the output and transfer characteristics, can be explained by the change of graphene lattice. The Raman spectra confirm the slight lattice deformation after electron irradiation and the structural damage after proton irradiation. Through comparison, it is also found that the proton irradiation will induce more severe influence on the devices than electron irradiation, due to the larger effective interaction radius of the proton. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics. 2023/08, Vol. 37, Issue 21, p1
  • Document Type:Article
  • Subject Area:Physics
  • Publication Date:2023
  • ISSN:0217-9792
  • DOI:10.1142/S0217979223502053
  • Accession Number:164305662
  • Copyright Statement:Copyright of International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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