JOURNAL ARTICLE
A novel thermionic crystal electron emission effect similar to Kikuchi lines.
Published In: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 2023, v. 41, n. 1. P. 1 1 of 3
Database: Applied Science & Technology Source Ultimate 2 of 3
Authored By: Katsap, Victor 3 of 3
Abstract
This article focuses on the discovery of a novel thermionic emission diffraction effect observed in lanthanum hexaboride (LaB6) cathodes, which resembles but differs from the well-known Kikuchi lines generated by electron beam diffraction. Using cathode emission imaging, the study shows that high-quality (100)-oriented LaB6 crystals exhibit a distinctive cross-like emission pattern linked to low work function (~2.60 eV), while poor-quality crystals lack this pattern. The effect is hypothesized to arise from electron waveguiding along specific low-index crystalline planes within the LaB6 crystal, facilitating collision-free electron transport to the emitting surface. This phenomenon may serve as a criterion for identifying thermionic materials with favorable emission properties based on crystal orientation and lattice structure.
Additional Information
- Source:Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics. 2023/01, Vol. 41, Issue 1, p1
- Document Type:Article
- Subject Area:Physics
- Publication Date:2023
- ISSN:21662746
- DOI:10.1116/6.0002375
- Accession Number:161416373
- Copyright Statement:Copyright of Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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