JOURNAL ARTICLE

ISTFA 2025 NANOPROBING AND SCANNING PROBE MICROSCOPY USER GROUP.

  • Published In: Electronic Device Failure Analysis, 2026, v. 28, n. 1. P. 30 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Lockledge, Scott P.; Anthony, Ricky; Daniel, Tad; Germanicus, Rosine Coq 3 of 3

Abstract

The article focuses on the ISTFA 2025 Nanoprobing and Scanning Probe Microscopy User Group, highlighting advanced nanoprobing for failure analysis, ultra-high-frequency AC techniques nanoprobing, and industry innovations presented by experts from Tiptek LLC and Kleindiek Inc.

Additional Information

  • Source:Electronic Device Failure Analysis. 2026/02, Vol. 28, Issue 1, p30
  • Document Type:Article
  • Subject Area:Science
  • Publication Date:2026
  • ISSN:1537-0755
  • Accession Number:191336859

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