JOURNAL ARTICLE
Bootstrap-Based Resampling Methods for Software Reliability Measurement Under Small Sample Condition.
Published In: Journal of Circuits, Systems & Computers, 2024, v. 33, n. 9. P. 1 1 of 3
Database: Academic Search Ultimate 2 of 3
Authored By: Zhang, Wei; Jiang, Jianhui 3 of 3
Abstract
Highly reliable software systems rarely fail during tests because they are usually designed with fault-tolerant mechanisms and tested comprehensively. It is usually difficult to obtain sufficient failure data to carry out reliability measurements by using traditional software reliability models. These models are typically based on probabilistic statistics, and the measurement accuracy cannot be guaranteed with insufficient failure data. We propose a nonparametric bootstrap (NBP) resampling method and six parametric bootstrap (PB) resampling methods to construct software reliability models for small sample conditions based on commonly used models, i.e., the Jelinski–Moranda (J–M), Goel–Okumoto (G–O), Musa–Okumoto (M–O), Schneidewind, Duane and Littlewood-Verrall models. The bootstrap is a statistical procedure that resamples a single dataset to create many simulated samples. Our experimental results on fourteen failure datasets collected from industry and academia show that the proposed models improve by 10.2–18.0% failure time prediction accuracy, 24.7–30.7% curve fitting accuracy, and 7.7–42.9% reliability measurement accuracy compared with the original models. Furthermore, our approaches achieve 58.3–91.1% better failure time prediction accuracy in the case of small sample conditions compared to state-of-the-art machine learning and neural network-based methods. Overall, our approaches can perform more accurate reliability measurements than the original models even in scenarios with limited failure data. [ABSTRACT FROM AUTHOR]
Additional Information
- Source:Journal of Circuits, Systems & Computers. 2024/06, Vol. 33, Issue 9, p1
- Document Type:Article
- Subject Area:Science
- Publication Date:2024
- ISSN:0218-1266
- DOI:10.1142/S0218126624501615
- Accession Number:177062343
- Copyright Statement:Copyright of Journal of Circuits, Systems & Computers is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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