JOURNAL ARTICLE

Development of a femtosecond analytical electron microscopy based on a Schottky field emission transmission electron microscope.

  • Published In: Review of Scientific Instruments, 2025, v. 96, n. 3. P. 1 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Ji, Shaozheng; Guo, Jiangteng; Li, Zefang; Tong, Ling; Guo, Junqing; Liu, Jingchao; Deng, Ying; Liu, Can; Sun, Zepeng; Chen, Xiang; Gao, Cuntao; Liu, Fang; Feng, Min; Fu, Xuewen 3 of 3

Abstract

This article focuses on the development and performance evaluation of an ultrafast transmission electron microscopy (UTEM) system based on a laser-driven Schottky field emitter integrated into a Thermo Fisher Scientific Talos200i transmission electron microscope. The study details the optimization of brightness, temporal resolution (~200 femtoseconds), energy dispersion (0.7 eV), and stability in the ultrafast photoemission mode, alongside beam size characterization in scanning transmission electron microscopy (STEM) mode achieving ~1.4 nm resolution. Application examples include ultrafast electron diffraction studies of photoinduced structural dynamics in polycrystalline gold films and MoS2 thin flakes, as well as polarization-dependent optical interference mapping in focused ion beam-prepared silicon thin films using photoinduced near-field electron microscopy (PINEM). These results demonstrate the UTEM’s capabilities for high spatiotemporal resolution investigations and provide insights for further advancements in ultrafast electron microscopy technology.

Additional Information

  • Source:Review of Scientific Instruments. 2025/03, Vol. 96, Issue 3, p1
  • Document Type:Article
  • Subject Area:Science
  • Publication Date:2025
  • ISSN:0034-6748
  • DOI:10.1063/5.0226913
  • Accession Number:184175704
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