JOURNAL ARTICLE

Reciprocal‐space mapping calculations of X‐ray Laue diffraction in a crystal with thermomigration channels.

  • Published In: Journal of Applied Crystallography, 2025, v. 58, n. 1. P. 260 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Punegov, Vasily 3 of 3

Abstract

X‐ray diffraction in a crystal with lattice strains is studied theoretically using two‐dimensional recurrence relations in Laue geometry. Based on these relations, an algorithm for calculating the coherent scattering intensity near a reciprocal‐lattice node is developed. Simulation of reciprocal‐space mapping was performed for a model of a silicon crystal with Si(Al) thermomigration channels. The change in reciprocal‐space maps is shown depending on the strain magnitude in the channel and scanning of the X‐ray beam along the input surface of the crystal. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:Journal of Applied Crystallography. 2025/02, Vol. 58, Issue 1, p260
  • Document Type:Article
  • Subject Area:Science
  • Publication Date:2025
  • ISSN:0021-8898
  • DOI:10.1107/S1600576724012366
  • Accession Number:183983088
  • Copyright Statement:Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Looking to go deeper into this topic? Look for more articles on EBSCOhost.