JOURNAL ARTICLE
Controlled Charge Polarity in WSe2 Field‐Effect Transistor Grown by Self‐Flux Method.
Published In: Physica Status Solidi (B), 2025, v. 262, n. 7. P. 1 1 of 3
Database: Academic Search Ultimate 2 of 3
Authored By: Le Thi, Hai Yen; Uddin, Inayat; Phan, Nhat Anh Nguyen; Yoo, Won Jong; Kim, Gil‐Ho 3 of 3
Abstract
In 2D materials, tungsten diselenide (WSe2) has great potential for optical and electronic devices. However, the quality of WSe2 crystals, determined by defects and grain boundaries, currently restricts its performance in controlling carrier‐transport properties. Consequently, the most significant issue achieves superior growth of WSe2 crystals and appropriate metal contacts. Herein, a doping‐free approach to manipulate the polarity of WSe2 transistors by utilizing distinct metal contacts is presented. WSe2 field‐effect transistors are examined employing low‐ and high‐work function metals. In these findings, a transition in polarity from n‐type for In and Cr to p‐type for Pd and Au is demonstrated, showcasing remarkably high on/off ratios (≈107) and mobilities (≈117 cm2 V−1 s−1) at room temperature. This straightforward polarity control technique can be further extended by utilizing contact architecture‐based research in other 2D materials for future nano‐electrical and optoelectronic devices. [ABSTRACT FROM AUTHOR]
Additional Information
- Source:Physica Status Solidi (B). 2025/07, Vol. 262, Issue 7, p1
- Document Type:Article
- Subject Area:Science
- Publication Date:2025
- ISSN:0370-1972
- DOI:10.1002/pssb.202400436
- Accession Number:186313033
- Copyright Statement:Copyright of Physica Status Solidi (B) is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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