JOURNAL ARTICLE

Z-scan nonlinear refraction model with elliptical Gaussian beam.

  • Published In: Journal of Nonlinear Optical Physics & Materials, 2026, v. 35, n. 2. P. 1 1 of 3

  • Database: Academic Search Ultimate 2 of 3

  • Authored By: Kessi, Ferhat 3 of 3

Abstract

This paper presents a theoretical model for an arbitrary n -order nonlinear refraction using an elliptical Gaussian beam propagating in a thin nonlinear medium. In contrast to circular Gaussian beams, elliptical Gaussian beams better represent real laser beams and distortions. The model derives an analytical expression for the optical normalized transmittance in Z -scan experiments. This is achieved by using the Gaussian decomposition method and weak phase approximation. The transmittance depends on the on-axis nonlinear phase shift, elliptical beam sizes along transverse axes, and the nonlinear refractive index. Fitting the expression to Z -scan data extracts these parameters. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:Journal of Nonlinear Optical Physics & Materials. 2026/03, Vol. 35, Issue 2, p1
  • Document Type:Article
  • Subject Area:Science
  • Publication Date:2026
  • ISSN:0218-8635
  • DOI:10.1142/S0218863525500109
  • Accession Number:191891932
  • Copyright Statement:Copyright of Journal of Nonlinear Optical Physics & Materials is the property of World Scientific Publishing Company and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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