JOURNAL ARTICLE

Low-Resistance Meter Circuit.

  • Published In: Grenze International Journal of Engineering & Technology (GIJET), 2025, v. 11, n. Part1. P. 322 1 of 3

  • Database: Applied Science & Technology Source Ultimate 2 of 3

  • Authored By: Gupta, Aaryan; Kale, Ayush; Patil, Ninad; Thorat, Shravani; Deshpande, Pallavi 3 of 3

Abstract

The primary objective of the paper was to design a low-resistance meter that would further increase the accuracy and repeatability involved in the measurement of resistances as low as 0.1 O. The project embraced a Wheatstone Bridge with four-wire Kelvin sensing and rather sophisticated noise-reduction techniques in an attempt to minimize errors due to contact resistance, thermal EMF, and lead resistance. It was compared with standard digital multimeters, and significantly fewer errors in lowresistance measurements were obtained. Calibration and testing have been carried out that confirm higher accuracy and stability for the new meter. For future versions, efforts can go into automation and further noise reduction, focusing especially on industrial applications. [ABSTRACT FROM AUTHOR]

Additional Information

  • Source:Grenze International Journal of Engineering & Technology (GIJET). 2025/01, Vol. 11, Issue Part1, p322
  • Document Type:Article
  • Subject Area:Science
  • Publication Date:2025
  • ISSN:23955287
  • Accession Number:186932638
  • Copyright Statement:Copyright of Grenze International Journal of Engineering & Technology (GIJET) is the property of GRENZE Scientific Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

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