The Multidimensionality of Measurement Bias in High‐Stakes Testing: Using Machine Learning to Evaluate Complex Sources of Differential Item Functioning.
Published In: Educational Measurement: Issues & Practice, 2023, v. 42, n. 1. P. 24 1 of 3
Database: Academic Search Ultimate 2 of 3
Authored By: Belzak, William C. M. 3 of 3
Abstract
Test developers and psychometricians have historically examined measurement bias and differential item functioning (DIF) across a single categorical variable (e.g., gender), independently of other variables (e.g., race, age, etc.). This is problematic when more complex forms of measurement bias may adversely affect test responses and, ultimately, bias test scores. Complex forms of measurement bias include conditional effects, interactions, and mediation of background information on test responses. I propose a multidimensional, person‐specific perspective of measurement bias to explain how complex sources of bias can manifest in the assessment of human knowledge, skills, and abilities. I also describe a data‐driven approach for identifying key sources of bias among many possibilities—namely, a machine learning method commonly known as regularization. [ABSTRACT FROM AUTHOR]
Additional Information
- Source:Educational Measurement: Issues & Practice. 2023/03, Vol. 42, Issue 1, p24
- Document Type:Article
- Subject Area:Social Sciences and Humanities
- Publication Date:2023
- ISSN:0731-1745
- DOI:10.1111/emip.12486
- Accession Number:162672149
- Copyright Statement:Copyright of Educational Measurement: Issues & Practice is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Looking to go deeper into this topic? Look for more articles on EBSCOhost.